2 nti 50.8mm Sapphire Wafer C-Plane M-plane R-plane A-plane Thickness 350um 430um 500um
Specification ntawm txawv orientations
Kev taw qhia | C(0001)-Axis | R(1-102)-Axis | M(10-10) -Axis | A(11-20)-Axis | ||
Lub cev muaj zog | Lub C axis muaj lub teeb ci siv lead ua, thiab lwm cov axes muaj lub teeb tsis zoo. Plane C yog tiaj, nyiam dua txiav. | R-dav hlau me ntsis nyuaj dua A. | M dav hlau yog stepped serrated, tsis yooj yim rau txiav, yooj yim txiav. | Lub hardness ntawm A-dav hlau yog ho siab dua li ntawm C-plane, uas yog manifested nyob rau hauv hnav tsis kam, khawb kuj thiab siab hardness; Sab A-dav hlau yog lub dav hlau zigzag, uas yooj yim txiav; | ||
Daim ntawv thov | C-oriented sapphire substrates yog siv los loj hlob III-V thiab II-VI tso cov yeeb yaj kiab, xws li gallium nitride, uas tuaj yeem tsim cov khoom siv xiav LED, laser diodes, thiab daim ntawv thov infrared detector. | R-oriented substrate kev loj hlob ntawm txawv deposited silicon extrasystals, siv nyob rau hauv microelectronics integrated circuits. | Nws yog tsuas yog siv los loj hlob tsis-polar / semi-polar GaN epitaxial films los txhim kho lub luminous efficiency. | A-oriented rau lub substrate ua ib tug uniform permittivity / nruab nrab, thiab ib tug high degree ntawm rwb thaiv tsev yog siv nyob rau hauv hybrid microelectronics technology. Cov kub kub superconductors tuaj yeem tsim los ntawm A-puag elongated crystals. | ||
Kev muaj peev xwm ua tau | Qauv Sapphire Substrate (PSS): Nyob rau hauv daim ntawv ntawm Kev Loj Hlob lossis Etching, nanoscale tshwj xeeb microstructure qauv yog tsim thiab ua rau ntawm sapphire substrate los tswj lub teeb pom kev zoo ntawm LED, thiab txo qhov sib txawv ntawm GaN loj hlob ntawm sapphire substrate. , txhim kho lub epitaxy zoo, thiab txhim khu lub internal quantum efficiency ntawm lub LED thiab ua rau kom lub efficiency ntawm lub teeb extraction. Tsis tas li ntawd, sapphire prism, daim iav, lens, qhov, lub khob hliav qab thiab lwm yam khoom siv tuaj yeem kho raws li cov neeg siv khoom xav tau. | |||||
Daim ntawv tshaj tawm | Qhov ntom | Hardness | melt point | Refractive index (pom thiab infrared) | Kev xa tawm (DSP) | Dielectric tsis tu ncua |
3,98g 3 | 9 (hli) | 2053 ℃ | 1.762-1.770 Nws | ≥85% | 11.58 @ 300K ntawm C axis (9.4 ntawm A axis) |